Scanning Electron Microscope

The JEOL JSM-IT500 Scanning Electron Microscope is equipped with Oxford ULTIM MAX SDD-EDS detector.

• Computer-controlled system based on Windows 10
• Enhanced imaging performance at low accelerating voltages
• Large chamber and stages
• Motorized stage (X, Y, T, R, Z)
• 30 volts to 30 kv accelerating voltage
• Quant analysis
• Line scan*
• X-ray mapping with automated large area mapping feature* (capable of mapping a full geological thin section or mounted block)
• Live mapping feature
• Feature or particle analysis

* TruLine and TruMAP options are available which corrects any background noise and possible elemental overlaps.

Sample preparation and holder

There are a few options available for samples size and type. Here are some examples:

• Thin section holders (one thin section at a time) -
• 6 thin sections into the chamber simultaneously -
• Mounted blocks holder (12 polished mounted blocks of 25 mm in diameters or 4 polished mounted blocks of 30 mm in diameters)
• A stage stub with 200 mm in diameter

For sample preparation please refer to: https://earthsci.carleton.ca/research-facilities/electron-microprobe-laboratory

¹Each run is up to 4 thin sections and 5 mounted blocks of 25mm in diameter
 

Contact Information

Maryam Shahabi Far
Microbeam Imaging and Analysis Specialist
Maryam [dot] shahabifarcarleton [dot] ca
(613) 520-2600 ext. 4415